Title: SiGe channel technology: superior reliability toward ultra-thin EOT devices—Part I: NBTI
Authors: Franco, Jacopo ×
Kaczer, Ben
Roussel, Philippe
Mitard, Jerome
Cho, Moon Ju
Witters, Liesbeth
Grasser, Tibor
Groeseneken, Guido #
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:1 pages:396-404
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science