Title: Border traps in Ge/III-V channel devices: Analysis and reliability aspects
Authors: Simoen, Eddy
Lin, Dennis
Alian, AliReza
Brammertz, Guy
Merckling, Clement
Mitard, Jerome
Claeys, Cor
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:13 issue:4 pages:444-455
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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