|ITEM METADATA RECORD
|Title: ||Border traps in Ge/III-V channel devices: Analysis and reliability aspects|
|Authors: ||Simoen, Eddy|
|Issue Date: ||2013 |
|Publisher: ||Institute of Electrical and Electronics Engineers|
|Series Title: ||IEEE Transactions on Device and Materials Reliability vol:13 issue:4 pages:444-455|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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