Title: Channel hot carrier degradation mechanism in long/short channel n-FinFETs
Authors: Cho, Moon Ju
Roussel, Philippe
Kaczer, Ben
Degraeve, Robin
Franco, Jacopo
Aoulaiche, Marc
Chiarella, Thomas
Kauerauf, Thomas
Horiguchi, Naoto
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:12 pages:4002-4007
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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