Title: Low frequency noise analysis for post-treatment of replacement metal gate FinFET
Authors: Lee, Jae Woo
Simoen, Eddy
Veloso, Anabela
Cho, Moon Ju
Arimura, Hiroaki
Boccardi, Guillaume
Ragnarsson, Lars-Ake
Chiarella, Thomas
Horiguchi, Naoto
Thean, Aaron
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:9 pages:2960-2962
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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