Title: Endurance/retention trade-off on HfO2 / metal cap 1T1R bipolar RRAM
Authors: Chen, Yang Yin
Goux, Ludovic
Clima, Sergiu
Govoreanu, Bogdan
Degraeve, Robin
Kar, Gouri Sankar
Fantini, Andrea
Groeseneken, Guido
Wouters, Dirk
Jurczak, Malgorzata
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:3 pages:1114-1121
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous

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