Title: A simulation study on process sensitivity of a line tunnel field-effect transistor
Authors: Walke, Amey
Vandenberghe, William
Kao, Frank
Vandooren, Anne
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:3 pages:1019-1027
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors

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