Title: Nanoprober-based EBIC measurements for nanowire transistor structures
Authors: Arstila, Kai
Hantschel, Thomas
Schulze, Andreas
Vandooren, Anne
Verhulst, Anne
Rooyackers, Rita
Eyben, Pierre
Vandervorst, Wilfried
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:105 pages:99-102
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section

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