Title: Analysis of smearing-out in contribution plot based fault isolation for Statistical Process Control
Authors: Van den Kerkhof, Pieter
Vanlaer, Jef
Gins, Geert
Van Impe, Jan # ×
Issue Date: Dec-2013
Publisher: Elsevier
Series Title: Chemical Engineering Science vol:104 pages:285-293
ISSN: 0009-2509
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Bio- & Chemical Systems Technology, Reactor Engineering and Safety Section
× corresponding author
# (joint) last author

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