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Title: Adaptive classification algorithm for EMC-compliance testing of electronic devices
Authors: Singh, Prashant ×
Deschrijver, Dirk
Pissoort, Davy
Dhaene, Tom #
Issue Date: 21-Nov-2013
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:49 issue:24 pages:1526-1528
Abstract: A novel technique that facilitates near-field (NF) scanning for electromagnetic compatibility-compliance testing is described. It performs measurements in a sequential way with the aim of discovering multiple, possibly disjoint regions where the amplitudes of an NF component belong to certain output ranges. The measured data samples are used to train a classification model where each NF range is represented by a given class (e.g. low/medium/high NF amplitudes). The outcome of the algorithm is a visual map that clearly characterises and pinpoints the exact location and boundaries of each class. Such maps are useful, for example, to detect hotspots or regions that are prone to electromagnetic compatibility issues. The technique has
been validated on a measured microstrip bend discontinuity.
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering (ESAT) TC, Technology Campus Ostend
Technologiecluster ESAT Elektrotechnische Engineering
× corresponding author
# (joint) last author

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