Title: X-ray CT for quantitative food microstructure engineering: The apple case
Authors: Herremans, Els
Verboven, Pieter
Defraeye, Thijs
Rogge, Seppe
Ho, Quang Tri
Hertog, Maarten
Verlinden, Bert
Bongaers, Evi
Estrade, Pascal
Wevers, Martine
Nicolai, Bart
Issue Date: 1-Jul-2013
Conference: International Conference on Tomography of Materials and Structures ICTMS 2013 edition:1st location:Ghent date:1-5 July 2013
Publication status: accepted
KU Leuven publication type: IMa
Appears in Collections:Division of Mechatronics, Biostatistics and Sensors (MeBioS)
Structural Composites and Alloys, Integrity and Nondestructive Testing

Files in This Item:

There are no files associated with this item.


All items in Lirias are protected by copyright, with all rights reserved.