Title: Comparing hierarchical linear models and randomization tests in the analysis of multiple baseline data
Authors: Heyvaert, Mieke ×
Moeyaert, Mariola
Ugille, Maaike
Van Den Noortgate, Wim
Onghena, Patrick #
Issue Date: Apr-2014
Conference: Annual Meeting of the American Educational Research Association (AERA) location:Philadelphia, Pennsylvania, USA date:3 - 7 April 2014
Publication status: accepted
KU Leuven publication type: IMa
Appears in Collections:Methodology of Educational Sciences
Faculty of Psychology and Educational Sciences, Campus Kulak Kortrijk – miscellaneous
Faculty of Psychology and Educational Sciences - miscellaneous
× corresponding author
# (joint) last author

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