Title: Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop
Authors: Marcon, Denis
Viaene, John
Favia, Paola
Bender, Hugo
Kang, Xuanwu
Lenci, Silvia
Stoffels, Steve
Decoutere, Stefaan
Issue Date: 2012
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:52 issue:9_10 pages:2188-2193
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications

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