|ITEM METADATA RECORD
|Title: ||Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop|
|Authors: ||Marcon, Denis|
|Issue Date: ||2012 |
|Series Title: ||Microelectronics Reliability vol:52 issue:9_10 pages:2188-2193|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Non-KU Leuven Association publications|
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