Title: Improved methodology for integrated k-value extractions
Authors: Ciofi, Ivan
Borrello, Gianpaolo
Madia, Oreste
Wilson, Chris
Vereecke, Bart
Beyer, Gerald
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:59 issue:6 pages:1607-1613
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications

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