|ITEM METADATA RECORD
|Title: ||Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements|
|Authors: ||Crupi, Felice|
|Issue Date: ||2012 |
|Publisher: ||Institute of Electrical and Electronics Engineers|
|Series Title: ||IEEE Transactions on Circuits and Systems 2, Express Briefs vol:59 issue:7 pages:439-442|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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