ITEM METADATA RECORD
Title: Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements
Authors: Crupi, Felice
Alioto, Massimo
Franco, Jacopo
Magnone, Paolo
Togo, Mitsuhiro
Horiguchi, Naoto
Groeseneken, Guido
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Circuits and Systems 2, Express Briefs vol:59 issue:7 pages:439-442
ISSN: 1549-7747
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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