Title: Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Authors: Nazir, Aftab
Eyben, Pierre
Clarysse, Trudo
Hellings, Geert
Schulze, Andreas
Mody, Jay
De Meyer, Kristin
Bender, Hugo
Vandervorst, Wilfried
Issue Date: 2012
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:74 pages:38-42
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
Associated Section of ESAT - INSYS, Integrated Systems

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