|ITEM METADATA RECORD
|Title: ||Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations|
|Authors: ||Nazir, Aftab|
De Meyer, Kristin
|Issue Date: ||2012 |
|Publisher: ||Pergamon Press|
|Series Title: ||Solid-State Electronics vol:74 pages:38-42|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Nuclear and Radiation Physics Section|
Associated Section of ESAT - INSYS, Integrated Systems
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