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Title: Impact of individual charged gate oxide defects on the entire ID-VG characteristic of nanoscaled FETs
Authors: Franco, Jacopo
Kaczer, Ben
Toledano Luque, Maria
Bukhori, Muhammad Faiz
Roussel, Philippe
Grasser, Tibor
Asenov, Asen
Groeseneken, Guido
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:33 issue:6 pages:779-781
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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