Title: BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic
Authors: Franco, Jacopo
Graziano, Salvatore
Kaczer, Ben
Crupi, Felice
Ragnarsson, Lars-Ake
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2012
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:52 issue:9_10 pages:1932-1935
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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