Title: Defect-centric perspective of time-dependent BTI variability
Authors: Toledano Luque, Maria
Kaczer, Ben
Franco, Jacopo
Roussel, Philippe
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2012
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:52 issue:9_10 pages:1883-1980
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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