Title: Insight into negative and positive bias temperature instability (N/PBTI) mechanism
Authors: Cho, Moon Ju ×
Lee, Jae-Duk
Aoulaiche, Marc
Kaczer, Ben
Roussel, Philippe
Kauerauf, Thomas
Degraeve, Robin
Franco, Jacopo
Ragnarsson, Lars-Ake
Groeseneken, Guido #
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:59 issue:8 pages:2042-2048
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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