Title: Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations
Authors: Nakashima, T ×
Idemoto, T
Tsunoda, I
Takakura, K
Yoneoka, M
Ohyama, H
Yoshino, K
Bargallo Gonzalez, Mireia
Simoen, Eddy
Claeys, Cor #
Issue Date: 2012
Publisher: Elsevier Sequoia
Series Title: Thin Solid Films vol:520 issue:8 pages:3337-3340
ISSN: 0040-6090
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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