Title: Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Authors: Lin, Dennis
Alian, AliReza
Gupta, S
Yang, B
Bury, Erik
Sioncke, Sonja
Degraeve, Robin
Toledano Luque, Maria
Krom, Raymond
Favia, Paola
Bender, Hugo
Caymax, Matty
Saraswat, K.C
Collaert, Nadine
Thean, Aaron
Issue Date: 2012
Host Document: International Electron Devices Meeting - IEDM
Conference: International Electron Devices Meeting - IEDM location:San Francisco, CA USA date:10/12/2012
Article number: 28,3
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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