Title: Buried silicon-germanium pMOSFETs: experimental analysis in VLSI logic circuits under aggressive voltage scaling
Authors: Crupi, Felice
Alioto, Massimo
Franco, Jacopo
Magnone, Paolo
Kaczer, Ben
Groeseneken, Guido
Mitard, Jerome
Witters, Liesbeth
Hoffmann, Thomas Y
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems vol:20 issue:8 pages:1487-1495
ISSN: 1063-8210
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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