Title: Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
Authors: Mengehini, Matteo
Stocco, Antonio
Bertin, Marcon
Marcon, Denis
Chini, Alessandro
Meneghesso, Gaudenzio
Zanoni, Enrico
Issue Date: Jan-2012
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:100 issue:3 pages:33505
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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