Title: An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
Authors: Trevisoli, R.D
Martino, J.A
Simoen, Eddy
Claeys, Cor
Pavanello, M.A
Issue Date: 2012
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:52 issue:3 pages:519-524
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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