|ITEM METADATA RECORD
|Title: ||An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices|
|Authors: ||Trevisoli, R.D|
|Issue Date: ||2012 |
|Series Title: ||Microelectronics Reliability vol:52 issue:3 pages:519-524|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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