Title: Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
Authors: Schulze, Andreas
Hantschel, Thomas
Dathe, Andre
Eyben, Pierre
Ke, Xiaoxing
Vandervorst, Wilfried
Issue Date: Jul-2012
Publisher: IOP Pub.
Series Title: Nanotechnology vol:23 issue:30 pages:305707
ISSN: 0957-4484
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section

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