Title: The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes
Authors: Kaczer, Ben
Franco, Jacopo
Toledano Luque, Maria
Roussel, Philippe
Bukhori, M. F
Asenov, Asen
Schwarz, Benedikt
Bina, Markus
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2012
Host Document: IEEE International Reliability Physics Symposium - IRPS pages:5A.2.1-5A.2.6
Conference: IEEE International Reliability Physics Symposium - IRPS location:Anaheim, CA USA date:15/04/2012
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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