|ITEM METADATA RECORD
|Title: ||Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors|
|Authors: ||Sun, Xiao|
Ma, T. P
|Issue Date: ||2012 |
|Publisher: ||American Institute of Physics|
|Series Title: ||Journal of Applied Physics vol:111 issue:5 pages:54102|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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