Title: Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
Authors: Franco, Jacopo
Kaczer, Ben
Toledano Luque, Maria
Roussel, Philippe
Mitard, Jerome
Ragnarsson, Lars-Ake
Witters, Liesbeth
Chiarella, Thomas
Togo, Mitsuhiro
Horiguchi, Naoto
Groeseneken, Guido
Bukhori, M.F
Grasser, T
Asenov, A
Issue Date: 2012
Host Document: International Reliability Physics Symposium - IRPS pages:5A-4
Conference: International Reliability Physics Symposium - IRPS location:Anaheim, CA USA date:15/04/2012
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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