Title: Gate length impact on UTBOX FBRAM devices
Authors: Nicoletti, T
Santos, S.D
Martino, J.A
Aoulaiche, Marc
Veloso, Anabela
Jurczak, Malgorzata
Simoen, Eddy
Claeys, Cor
Issue Date: 2012
Host Document: IEEE International SOI Conference pages:4,3
Conference: IEEE International SOI Conference location:Napa, CA USA date:01/10/2012
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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