ITEM METADATA RECORD
Title: Reliability concerns in copper TSV’s: methods and results
Authors: Croes, Kristof
Cherman, Vladimir
Li, Yunlong
Zhao, Larry
Barbarin, Yohan
De Messemaeker, Joke
Civale, Yann
Velenis, Dimitrios
Stucchi, Michele
Kauerauf, Thomas
Redolfi, Augusto
Dimcic, Biljana
Ivankovic, Andrej
Van der Plas, Geert
De Wolf, Ingrid
Beyer, Gerald
Swinnen, Bart
Tokei, Zsolt
Beyne, Eric
Issue Date: Jul-2012
Host Document: 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits - IPFA
Conference: 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits - IPFA location:Singapore date:02/07/2012
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Structural Composites and Alloys, Integrity and Nondestructive Testing
Mechanical Engineering - miscellaneous

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