Title: Modeling the impact of junction angles in tunnel field-effect transistors
Authors: Kao, Frank
Verhulst, Anne
Vandenberghe, William
Soree, Bart
Groeseneken, Guido
De Meyer, Kristin
Issue Date: 2012
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:69 issue:1 pages:31-37
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems

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