Title: Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
Authors: Martin-Martinez, Javier
Kaczer, Ben
Degraeve, Robin
Roussel, Philippe
Rodriguez, Rosana
Nafria, Monserrat
Aymerich, X
Dierickx, Bart
Groeseneken, Guido
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:12 issue:1 pages:78-85
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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