Title: HBM ESD robustness of GaN-on-Si Schottky diodes
Authors: Chen, Shih-Hung
Griffoni, Alessio
Srivastava, Puneet
Linten, Dimitri
Thijs, Steven
Scholz, Mirko
Marcon, Denis
Gallerano, A
Lafonteese, D
Concannon, A
Vashchenko, V.A
Hopper, P
Bychikhin, S
Pogany, D
Van Hove, Marleen
Decoutere, Stefaan
Groeseneken, Guido
Issue Date: 2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:12 issue:4 pages:589-598
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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