|ITEM METADATA RECORD
|Title: ||Characterization of chemically vapor deposited manganese barrier layers using X-ray absorption fine structure|
|Authors: ||Ablett, James|
Phuong, Nguyen Mai
|Issue Date: ||2012 |
|Publisher: ||Publication Board, Japanese Journal of Applied Physics|
|Series Title: ||Japanese Journal of Applied Physics 1, Regular Papers, Short Notes & Review Papers vol:51 issue:5 pages:05EB01|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Non-KU Leuven Association publications|
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