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Title: Isothermal defect annealing in semiconductors investigated by time-delayed Mössbauer spectroscopy: application to ZnO
Authors: Gunnlaugsson, H.P.
Weyer, G.
Mantovan, R.
Naidoo, D.
Sielemann, R.
Bharuth-Ram, K.
Fanciulli, M.
Johnston, K.
Olafsson, S.
Langouche, Guido
Issue Date: 2009
Publisher: Springer
Host Document: Hyperfine Interactions vol:188 issue:1-3 pages:85-89
Conference: 29th International Conference on the Applications of the Mossbauer Effect (ICAME) location:Kanpur, India date:14-19 October 2007
ISSN: 0304-3843
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Nuclear and Radiation Physics Section

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