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Title: Growth and Morphology of Sputtered Aluminum Thin Films on P3HT Surfaces
Authors: Kaune, Gunar ×
Metwalli, Ezzeldin
Meier, Robert
Koerstgens, Volker
Schlage, Kai
Couet, Sebastien
Roehlsberger, Ralf
Roth, Stephan V
Mueller-Buschbaum, Peter #
Issue Date: 2011
Publisher: American Chemical Society
Series Title: ACS Applied Materials and Interfaces vol:3 issue:4 pages:1055-1062
Abstract: Growth and morphology of an aluminum (Al)
contact on a poly(3-hexylthiophene) (P3HT) thin film are
investigated with X-ray methods and related to the interactions
at the Al:P3HT interface. Grazing incidence small-angle scattering
(GISAXS) is applied in situ during Al sputter deposition to
monitor the growth of the layer. A growth mode is found, in
which the polymer surface is wetted and rapidly covered with a
continuous layer. This growth type results in a homogeneous film
without voids and is explained by the strong chemical interaction
between Al and P3HT, which suppresses the formation of threedimensional
cluster structures. A corresponding three stage growth model (surface bonding, agglomeration, and layer growth) is
derived. X-ray reflectivity shows the penetration of Al atoms into the P3HT film during deposition and the presence of a 2 nm thick
intermixing layer at the Al:P3HT interface.
ISSN: 1944-8244
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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