Title: Reliability analysis of permanent degradations on AlGaN/GaN HEMTs
Authors: Marcon, Denis ×
Meneghesso, Gaudenzio
Wu, Tian-Li
Stoffels, Steve
Meneghini, Matteo
Zanoni, Enrico
Decoutere, Stefaan #
Issue Date: 20-Sep-2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:10 pages:3132-3141
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science