ITEM METADATA RECORD
Title: The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements
Authors: Witvrouw, Ann ×
Maex, Karen
De Ceuninck, W
Lekens, G
D'Haen, J
De Schepper, L #
Issue Date: 1998
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Series Title: Microelectronics Reliability vol:38 issue:6-8 pages:1035-1040
Conference: 9th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 98) location:Copenhagen, Denmark date:1998
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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