ITEM METADATA RECORD
Title: MEMS packaging and reliability: An undividable couple
Authors: Tilmans, H. A. C ×
De Coster, J
Helin, P
Cherman, V
Jourdain, A
De Moor, P
Vandevelde, B
Pham, N. P
Zekry, Joseph
Witvrouw, Ann
De Wolf, Ingrid #
Issue Date: 2012
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Series Title: Microelectronics Reliability vol:52 issue:9-10 pages:2228-2234
Conference: 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF) in Conjunction with the 3rd International Symposium on Reliability of Optoelectronics for Space (ISROS) location:Cagliari, Italy date:1-5 October 2012
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Structural Composites and Alloys, Integrity and Nondestructive Testing
× corresponding author
# (joint) last author

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