Title: High mobility strained ge pMOSFETs with high-kappa/metal gate
Authors: Nicholas, Gareth ×
Grasby, T. J
Lgoni, D. J. E. Fu
Beer, C. S
Parsons, J
Meuris, M
Heyns, Marc #
Issue Date: 2007
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:28 issue:9 pages:825-827
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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