Title: Goodness-of-fit inferences through posterior distribution explorations
Authors: Vynckier, C ×
Beirlant, Jan
Tierney, L #
Issue Date: 1996
Publisher: Physica verlag gmbh
Series Title: Computational statistics vol:11 issue:2 pages:147-163
Abstract: Markov chain-based explorations of a higher-dimensional posterior distribution can be used for goodness-of-fit purposes. Searching for parameter configurations optimizing an objective function through dynamic graphical methods can yield important insights about the distance between the model and reality. Extreme value techniques can be used to estimate the extrema of the objective function.
ISSN: 0943-4062
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Statistics Section
× corresponding author
# (joint) last author

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