IMS Workshop on “The Importance of Low-frequency Measurements on High-frequency Characterization", Date: 2013/06/03 - 2013/06/03, Location: Seattle, WA, USA
Publication date:
2013-06-01
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IMS Workshop on “The Importance of Low-frequency Measurements on High-frequency Characterization"
Author:
Remley, KA
Farsi, Saeed ; Schreurs, Dominique ; Williams, D ; Hale, P ; Wang, J