Title: Defects in neutron transmutation doped silicon studied by positron annihilation lifetime measurements
Authors: Coeck, M ×
Balcaen, N
Van Hoecke, T
Van Waeyenberge, B
Segers, D
Dauwe, C
Laermans, Christiane #
Issue Date: 2000
Publisher: Amer inst physics
Series Title: Journal of Applied Physics vol:87 issue:8 pages:3674-3677
Abstract: Neutron transmutation doping of n-type silicon was obtained by irradiating the samples with thermal neutrons in order to create P atoms. Positron lifetime measurements were carried out and the evolution of the induced defects was studied by thermal annealing of the samples. The annealing out of the divacancy was seen between 200 and 350 degrees C. Around 700 degrees C large vacancy clusters (containing about eight vacancies) are formed. All the defects are annealed above 800 degrees C. (C) 2000 American Institute of Physics. [S0021-8979(00)01908-3].
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
× corresponding author
# (joint) last author

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