Title: Recent trends in CMOS reliability: from individual traps to circuit simulations
Authors: Kaczer, B.
Toledano-Luque, M.
Franco, J.
Grasser, T.
Roussel, Ph. J
Camargo, V.V.A.
Mahato, S.
Simoen, E.
Catthoor, F.
Wirth, G.I.
Groeseneken, G. #
Issue Date: 2-Feb-2012
Host Document: IEEE International Integrated Reliability Workshop Final Report (IRW), 2011
Conference: IEEE International Integrated Reliability Workshop, 2011 location:South Lake Tahoe, CA, USA date:16-20 Oct. 2011
ISBN: 978-1-4577-0113-9
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

Files in This Item:
File Description Status SizeFormat
06142582-1.pdf Published 43KbAdobe PDFView/Open


All items in Lirias are protected by copyright, with all rights reserved.