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Title: A test object for calibration and accuracy assessment in X-ray CT metrology
Authors: Voet, André
Kiekens, Kim
Welkenhuyzen, Frank
Tan, Ye
Dewulf, Wim
Kruth, Jean-Pierre
Issue Date: 2010
Conference: International Symposium on Measurement and Quality Control edition:10 location:Convention Center, Osaka University,, Japan date:5-9 September 2010
Abstract: While Computer Tomography (CT) has since long been used for medical applications and material inspection, its application field has recently been broadened to include dimensional metrology in industry. However, the accuracy of CT-based measurements remains yet largely uncertain. Not only are the measurements influenced by a number of factors and parameters like e.g. workpiece orientation, magnification, edge detection… but also the calibration method matters greatly. This paper investigates the influence of these factors and parameters and the calibration method (rescaling and correction) on accuracy and repeatability of the measurements, using a test object with parallel grooves. The test object is also used to illustrate how more accurate CMM measurements can be used to calibrate CT measurements and to compare different calibration and compensation strategies.
URI: 
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
Centre for Industrial Management / Traffic & Infrastructure
Mechanical Engineering Technology TC, Technology Campus De Nayer Sint-Katelijne-Waver
Mechanical Engineering Technology TC, Campus Group T Leuven
Technologiecluster Werktuigkundige Industriële Ingenieurstechnieken

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