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Title: Contribution of CIRP to the development of metrology and surface quality evaluation during the last fifty years
Authors: Peters, J ×
Bryan, JB
Estler, WT
Evans, C
Kunzmann, H
Lucca, DA
Sartori, S
Sato, H
Thwaite, EG
Vanherck, Paul #
Issue Date: 2001
Publisher: Elsevier BV
Series Title: CIRP Annals. Manufacturing Technology vol:50 issue:2 pages:471-488
Abstract: An overview of the contribution of the members of the C.I.R.P. community to the progress of Metrology and Surface Roughness Quality Evaluation is given. The following items are included in the part on metrology: brief overview of the existing situation before 1950, contribution to the successive definitions of the unit of length and related reference length standards, traceability, preliminary work to standardization, thermal effects, design and construction of precision machine tools and measuring machines, CMM, large scale metrology.
URI: 
ISSN: 0007-8506
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
× corresponding author
# (joint) last author

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