Title: Defect Loss: A New Concept for Reliability of MOSFETs
Authors: Duan, M ×
Zhang, J. F
Ji, Z
Zhang, Wei
Kaczer, B
De Gendt, Stefan
Groeseneken, Guido #
Issue Date: Apr-2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:33 issue:4 pages:480-482
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Molecular Design and Synthesis
× corresponding author
# (joint) last author

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