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Title: Bayesian deconvolution method applied to experimental Bidirectional Transmittance Distribution Functions
Authors: Audenaert, Jan ×
Leloup, Frédéric
Durinck, Guy
Deconinck, Geert
Hanselaer, Peter #
Issue Date: Mar-2013
Publisher: IOP Pub.
Series Title: Measurement Science & Technology vol:24 issue:3
Article number: 035202
Abstract: Optical simulations are a common tool in the development of luminaires
for lighting applications. The reliability of the virtual prototype is strongly dependent
on the accuracy of the input data such as the emission characteristics of the light
source and the scattering properties of the optical components (re
ectors, lters
and diusers). These scattering properties are characterized by the bidirectional
scatter distribution function (BSDF). Experimental determination of the BSDF of the
materials is however very sensitive to the characteristics of the measuring instrument,
i.e., the dimensions of the illumination spot, the detector aperture, etc. These
instrumental characteristics are re
ected in the instrument function. In order to
eliminate the in
uence of the instrument function the use of a Bayesian deconvolution
technique is proposed. A suitable stopping rule for the iterative deconvolution
algorithm is presented. The deconvolution method is validated using Monte Carlo ray
tracing software by simulating a BSDF measurement instrument and a virtual sample
with a known bidirectional transmittance distribution function (BTDF). The Bayesian
deconvolution technique is applied to experimental BTDF data of holographic diusers,
which exhibit a symmetrical angular broadening under normal incident irradiation. In
addition, the eect of applying deconvolved experimental BTDF data on simulations
of luminance maps is illustrated.
ISSN: 0957-0233
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - ELECTA, Electrical Energy Computer Architectures
Informatics Section
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campuses Ghent and Aalst
× corresponding author
# (joint) last author

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