Title: The ENBIS-12 Special Issue
Authors: Goos, Peter ×
De Ketelaere, Bart #
Issue Date: Dec-2012
Publisher: John Wiley & Sons, Ltd.
Series Title: Quality and Reliability Engineering International vol:28 issue:8 pages:991-991
ISSN: 0748-8017
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Division of Mechatronics, Biostatistics and Sensors (MeBioS)
× corresponding author
# (joint) last author

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