Title: A quantitative stress-related model for the evolution of the pore size in porous silicon during high temperature annealing
Authors: Hassan, Moustafa M ×
Ghannam, Moustafa Y
Poortmans, Jozef
Mertens, Robert Pierre #
Issue Date: Dec-2006
Publisher: Elsevier
Series Title: Nuclear Instruments & Methods in Physics Research B vol:253 issue:1-2 pages:269-273
ISSN: 0168-583X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - ELECTA, Electrical Energy Computer Architectures
× corresponding author
# (joint) last author

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